Bonan Yan received his Ph.D. in Electrical and Computer Engineering from Duke University in 2020. He obtained his Master's degree in Electrical Engineering from the University of Pittsburgh in 2017 and his Bachelor's degree in Electronic Information Engineering from Beihang University in 2014. His research focuses on circuit and system design, design automation for emerging non-volatile memories, in-memory computing, and artificial intelligence chips. He has been advised by IEEE Fellow Prof. Yiran Chen and Prof. Hai "Helen" Li. His research work has been published in internationally renowned journals and conferences, including DAC, ICCAD, Symposium on VLSI Technology, and IEDM. Currently, he is a member of ACM and IEEE and serves as a reviewer for international academic journals such as IEEE T-ED, TCAD, TCAS-I, TVLSI, Scientific Reports, and conferences such as DAC, ISCAS, AICAS.
